Agilent Technologies has announced a strategic partnership with Aster Technologies to enable integration of Aster's TestWay Coverage Analyst with Agilent's printed-circuit-board assembly-test ...

The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Anyone involved in IC product sign-off that includes a mixed signal design portion knows that developing robust tests for these intricate designs has historically been a significant bottleneck, no ...

When asked, many engineers will say that the goal of a test plan for a PCB is full or 100% test coverage. When pressed further, they usually admit that 100% test coverage is virtually impossible to ...