Such features can make defect tracking fun and less of a boring activity for developers. It will help developers in generating better bug reports, making the entire process of defect management easier ...

ADE Corp. earlier this week offered up its latest darkfield wafer defect inspection tool, WaverXam. The tool offers a high-sensitivity mode with 33nm defect detection to meet tightening customer ...

Discover the top 7 test management software solutions for DevOps teams in 2025. Learn how these tools can enhance your testing processes, integrate with CI/CD pipelines, and improve software delivery ...

MILPITAS, Calif., July 10, 2018 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced two new defect inspection products, addressing two key challenges in tool and process monitoring ...